The Analog Discovery SDK has a number of functions for sampling and reporting "noise."
I cannot tell from the documentation what the noise refers to. It appears that the length of the noise data is 1/16th the length of the analog sample data.
Is it simply a way of doing min/max samplings on the regular analog data? Is there a discussion of these functions somewhere?
I'd be most grateful for any further information on this topic.
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blindgoat
The Analog Discovery SDK has a number of functions for sampling and reporting "noise."
I cannot tell from the documentation what the noise refers to. It appears that the length of the noise data is 1/16th the length of the analog sample data.
Is it simply a way of doing min/max samplings on the regular analog data? Is there a discussion of these functions somewhere?
I'd be most grateful for any further information on this topic.
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