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Generating I2C, SPI and CAN Test Data


DCSoutherner

Question

I need to generate test data for evaluating I2C, SPI and CAN devices (only one test at a time, so multiple simultaneous patterns are not necessary).

I've tried to get the Analog Discovery 2 to do that and it doesn't look like it will.

I've looked at the Digital Discovery and it's not clear that it can do that either.

I'm hoping I don't need a US$600+ device.

Any recommendations would be appreciated.

Thanks

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