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  1. Is there a way to alter the brightness or even color of the 'beam' line according to a signal input value such as a XYZ oscilloscope? That means: Two output channels create an XY-progressive scan for surface detection. One or two sensor(s) are connected to analog inputs which will modify the 'beam brightness' (or even color by a LUT) according to the scan positions, so a 3D surface profile of a specimen can be acquired and be visible on screen. Would be great if this works Thanks for any (helping) reply Peter