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Everything posted by hlipka

  1. In my Digital Discovery review at Element14, I looked at some options. The ones you linked to probably work well. But they will be a little bit too thick, so you cannot have more than about 4 beneath each other on a 2.54mm grid. Look for smaller ones, e.g. https://www.amazon.com/grabber-Jumper-Analyzer-Testing-Accessories/dp/B075JF9QGN/ .
  2. Thanks for your response. Is there anyway in the Pattern Generator to specify the number of clock cycles? I can see only a time-based limit. Thanks, hli
  3. I have used the I2C scripting with a sub address successfully, using the Protocol tool. My example was reading the SHT21, using this line: var reg_humidity = Read(0x40, 0xE5, 3); Note that this function is using 7-bit addresses. When you are able to talk with your I2C device successfully using the 'I2C Master' tool, you can use the settings there to write a script. From the documentation of the scripting in the I2C Protocol tool, it seems than Read(address, bytes) does not use the sub address specified in the tool (although I did not test this).
  4. Btw: timestamps would be helpful in the protocol interface. When monitoring long-running protocol transaction its otherwise difficult to distinguish which parts happen together and which didn't.
  5. I'm using the sync mode, triggered by the pattern generator. My config is one 14 bit counter (DIO24-DIO37), and a clock on a single signal (DIO38). The logic analyzer is configured to sample DIN0-DIN7 on the rising flank of DIO20 (which I connected to DIO38). But I'm missing the first 8 samples. How do I know? The device-under-test is a ROM and I already know its contents. I actually get the correct values when the counter on the pattern generator wrap around and starts again. I verified with a scope that the generated pattern is correct (so the sample clock starts at the correct time). Is thi
  6. You can also export the whole data set to CSV and parse it with a program. Just enable the 'logging' view and export the 'Logic' source to a file (on each acquisition).